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TEL LST-1 3281-000147-17主控板

发布时间:2026-10-15人气:
  • TEL LST-1 3281-000147-17主控板
  • TEL LST-1 3281-000147-17主控板
  • TEL LST-1 3281-000147-17主控板

TEL LST-1 3281-000147-17主控板  

1.产 品 资 料 介 绍:

TEL LST-1 3281-000147-17 主控板
产品特点
1. 晶圆测试设备专用主控单元,负责整机工艺逻辑运算,指令调度处理速度快。
2. 板载硬件信号隔离设计,抗电磁干扰,适配探针台机柜内复杂洁净工况。
3. 标准卡式插槽安装,集成故障自检电路,备件更换简单,缩短停机维修时间。
应用领域
1.TEL P-8 全自动晶圆探针台系统
2. 半导体晶圆电性测试设备
3. 芯片探针检测主控系统
4. 晶圆载台运动逻辑控制单元
5. 探针卡信号采集处理模组
6. 半导体良率检测设备
7. 晶圆自动上下料控制系统
8. 微电子器件测试平台
9. 半导体洁净测试工装
10. 精密芯片分选检测设备
产品参数
1. 支持设备内部专用总线,可与各类 IO 板、运动板通讯联动。
2. 工作温度 0~50℃,无凝露洁净环境长期稳定运行。
3. 板载多通道数字信号接口,具备上电自检与故障代码输出功能。
TEL LST-1 3281-000147-17 主控板是晶圆探针台核心控制板件,统筹设备运动、信号采集与测试流程,保障半导体晶圆电性检测作业稳定执行。

TEL LST-1 3281-000147-17主控板   产品英文介绍

TEL LST-1 3281-000147-17 main control board

Product Features

1. The dedicated main control unit for wafer testing equipment is responsible for the overall process logic calculation and fast instruction scheduling processing speed.

2. Onboard hardware signal isolation design, anti electromagnetic interference, suitable for complex and clean working conditions inside the probe station cabinet.

3. Standard card slot installation, integrated fault self checking circuit, easy replacement of spare parts, shortening downtime for maintenance.

Application Fields

1. TEL P-8 Fully Automatic Wafer Probe Station System

2. Semiconductor wafer electrical testing equipment

3. Chip probe detection main control system

4. Wafer stage motion logic control unit

5. Probe card signal acquisition and processing module

6. Semiconductor yield testing equipment

7. Automatic wafer loading and unloading control system

8. Microelectronics Device Testing Platform

9. Semiconductor Clean Testing Fixture

10. Precision chip sorting and testing equipment

Product Specifications

1. Support internal dedicated bus of the device, which can communicate and link with various IO boards and motion boards.

2. The working temperature is 0-50 ℃, and it operates stably in a clean environment without condensation for a long time.

3. Onboard multi-channel digital signal interface with power on self-test and fault code output functions.

The TEL LST-1 3281-000147-17 main control board is the core control board of the wafer probe station, which coordinates equipment movement, signal acquisition, and testing processes to ensure stable execution of semiconductor wafer electrical testing operations.

TEL LST-1 3281-000147-17主控板  产品展示

LST-1 3281-000147-17 3.webp.jpg

视频展示


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The content is from Ruichang Mingsheng Automation Equipment Co., LTD

Contact: +86 15270269218 

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