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KLA Tencor 500-22560-000电机控制器

发布时间:2025-05-29人气:
  • KLA Tencor 500-22560-000电机控制器
  • KLA Tencor 500-22560-000电机控制器

KLA-Tencor 500-22560-000电机控制器

1.产 品 资 料 介 绍:

中文资料:

KLA Tencor 500-22560-000 电机控制器 – 产品应用领域

KLA Tencor 500-22560-000 是一款用于精密设备中的专用 电机控制器模块(Motor Controller),其主要任务是驱动和控制精密电机在设备中的准确运动。它在KLA Tencor的检测与量测设备中具有以下典型应用:


1. 晶圆搬运与传输系统(Wafer Handling Systems)

  • 控制晶圆在检测设备中的上下料流程。

  • 精准驱动X/Y/Z轴运动平台或机械手臂,确保晶圆在多个工位间平稳传送。

2. 对位平台运动控制(Stage Motion Control)

  • 用于驱动高精度光学平台、扫描平台或旋转平台,实现纳米级运动控制,满足CD量测、Overlay检测等要求。

3. 光学对焦与镜头调节机构

  • 控制自动聚焦系统中的微型伺服电机或步进电机,保持成像系统在不同高度的稳定成像性能。

4. 激光或光源调整系统

  • 调节激光器或照明光源的角度、位置或焦点位置,确保光束路径稳定、图像清晰。

5. 探针或探头位置控制(如E-Beam或AFM设备)

  • 控制探测器在极微尺度下的位移与响应速度,用于表面轮廓扫描、缺陷检测等。


产品特性(推测)

特性描述
控制类型伺服/步进电机控制器(可能支持闭环反馈)
通信接口与主控制系统通过CAN、RS-485或PCIe通信
精度控制纳米或亚微米级别的位移控制
应用兼容性与KLA检测设备、量测平台无缝配合
抗干扰设计支持EMI抑制与系统稳定性优化

英文资料:

KLA Tencor 500-22560-000 Motor Controller - Product Application Fields

KLA Tencor 500-22560-000 is a specialized motor controller module used in precision equipment, whose main task is to drive and control the accurate movement of precision motors in the equipment. It has the following typical applications in KLA Tencor's detection and measurement equipment:


1. Wafer Handling Systems

Control the loading and unloading process of wafers in the testing equipment.


Accurately drive the X/Y/Z axis motion platform or robotic arm to ensure smooth transfer of wafers between multiple workstations.


2. Stage Motion Control

Used to drive high-precision optical platforms, scanning platforms, or rotating platforms, achieve nanoscale motion control, and meet requirements such as CD measurement and overlay detection.


3. Optical focusing and lens adjustment mechanism

Control the micro servo motor or stepper motor in the autofocus system to maintain stable imaging performance of the imaging system at different heights.


4. Laser or light source adjustment system

Adjust the angle, position, or focal point of the laser or illumination source to ensure a stable beam path and clear image.


5. Probe or probe position control (such as E-Beam or AFM equipment)

Control the displacement and response speed of the detector at the extremely micro scale for surface contour scanning, defect detection, etc.


Product characteristics (speculation)

Characteristic description

Control type: servo/stepper motor controller (may support closed-loop feedback)

The communication interface communicates with the main control system through CAN, RS-485, or PCIe

Precision control for displacement control at the nanometer or submicron level

Application compatibility seamlessly integrates with KLA detection equipment and measurement platforms

Anti interference design supports EMI suppression and system stability optimization

2.产      品      展      示      

500-22560-000_pcb_pmac_acc14-v_assy_delta_tau_602239-102_kla_tencor.jpg

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The content is from Ruichang Mingsheng Automation Equipment Co., LTD

Contact: +86 15270269218

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