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KLA Tencor 710-658177-20处理器模块

发布时间:2025-06-03人气:
  • KLA Tencor  710-658177-20处理器模块
  • KLA Tencor  710-658177-20处理器模块
  • KLA Tencor  710-658177-20处理器模块

KLA-Tencor 710-658177-20处理器模块

1.产 品 资 料 介 绍:

中文资料:

KLA Tencor 710-658177-20 处理器模块

KLA Tencor 710-658177-20 是一款用于晶圆检测系统中的处理器控制模块,常见于 KLA Tencor 的 2132/2135 系列等表面缺陷检测设备中,主要用于控制扫描系统中 X 轴的移动与同步,是整个图像采集与处理流程中的核心部件之一。


主要功能:

  • 控制晶圆平台在 X 轴方向的精准运动;

  • 负责实时位置插值计算,实现亚微米级运动控制;

  • 与图像采集系统协同运作,保证检测过程同步稳定;

  • 执行与运动控制、位置反馈、扫描时序等相关的核心处理任务。


应用领域:

  • 半导体制造中的晶圆缺陷检测;

  • 光学与电子束图像系统的位置控制;

  • 高精度扫描检测平台的核心控制单元;

  • KLA Tencor 表面检测系统中的关键运动控制模块。


产品信息:

  • 型号:710-658177-20

  • 类型:X-Interpolator Phase 3 处理器模块

  • 安装位置:位于检测设备主机内部控制区

  • 适配系统:如 KLA Tencor 2132 系列 200mm 缺陷检测平台

  • 工作方式:与主控制器、编码器接口、运动驱动电路协同运行

英文资料:

KLA Tencor 710-658177-20 processor module

KLA Tencor 710-658177-20 is a processor control module used in wafer inspection systems, commonly found in surface defect detection equipment such as KLA Tencor's 2132/2135 series. It is mainly used to control the movement and synchronization of the X-axis in scanning systems and is one of the core components in the entire image acquisition and processing process.


Main functions:

Control the precise movement of the wafer platform in the X-axis direction;


Responsible for real-time position interpolation calculation and achieving sub micron level motion control;


Collaborate with the image acquisition system to ensure synchronous and stable detection process;


Execute core processing tasks related to motion control, position feedback, scanning timing, etc.


Application areas:

Wafer defect detection in semiconductor manufacturing;


Position control of optical and electron beam imaging systems;


The core control unit of high-precision scanning and detection platform;


The key motion control module in the KLA Tencor surface inspection system.


Product information:

Model: 710-658177-20


Type: X-Interpolator Phase 3 processor module


Installation location: located in the internal control area of the detection device host


Adaptation system: such as KLA Tencor 2132 series 200mm defect detection platform


Working mode: Coordinated operation with the main controller, encoder interface, and motion drive circuit

2.产      品      展      示      

kla_710-658177-20_x_interpolator_phase_3_pcb_073-658176-00_2132_working_spare_1.jpg

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The content is from Ruichang Mingsheng Automation Equipment Co., LTD

Contact: +86 15270269218

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