KLA-Tencor 710-652840-20传感器模块
1.产 品 资 料 介 绍：
中文资料：
产品简介
型号：710-652840-20
类型：传感器模块（Random Input Filter，RIF）
功能：用于半导体晶圆检测设备中，负责对采集的图像信号进行预处理，过滤随机噪声和伪影，提高缺陷检测的准确性。
主要功能
过滤图像数据中的随机噪声，减少误报。
对信号进行放大、滤波和转换，保障信号质量。
模块化设计，便于与其他设备控制模块协同工作。
应用领域
晶圆表面缺陷检测和光学对位。
图像采集和预处理系统。
半导体设备洁净室环境，具备抗干扰和抗温度变化能力。
总结
该传感器模块是半导体检测系统中关键的图像信号处理组件，有效提升检测设备的稳定性和准确性。
英文资料：
Product Introduction
Model: 710-652840-20
Type: Sensor Module (Random Input Filter, RIF)
Function: Used in semiconductor wafer inspection equipment, responsible for preprocessing the collected image signals, filtering out random noise and artifacts, and improving the accuracy of defect detection.
major function
Filter random noise in image data to reduce false positives.
Amplify, filter, and convert signals to ensure signal quality.
Modular design facilitates collaboration with other device control modules.
application area
Surface defect detection and optical alignment of wafers.
Image acquisition and preprocessing system.
The clean room environment for semiconductor equipment has the ability to resist interference and temperature changes.
summarize
This sensor module is a key image signal processing component in semiconductor detection systems, effectively improving the stability and accuracy of detection equipment.
2.产 品 展 示
3.其他产品
4.其他英文产品
Asea 2668 170-3 Pcb Circuit Board
ASEA SNAT7600 driver control circuit board
ABB 3DDE300417 Input/Output Board
| R67GENA-R2-NS-NV-00 | R32SSNA-R2-NS-NV-10 | R33HENA-R2-NS-NV-00 |
| R67BENH-R2-NS-NV-00 | R24HENA-R1-NS-NV-01 | R32GEAC-R2-NS-NV-00 |
| R67BEAH-R2-NS-NV-00 | R43GEBA-TS-NS-NV-00 | S21GNNA-RNNL-00 |
| R65HENA-TS-NS-NV-00 | R43HCBA-R2-NS-VS-00 | R35GENH-R2-NS-NV-00 |
| R65HENA-TS-MZ-NV-00 | R33SSNC-SS-NS-NV-02 | R32GMP-R2-NS-NV-07 |
| R65HENA-R2-NS-NV-00 | R32GENP-R2-NS-VS-00 | R22GENT-TS-NS-NV-00 |
| R65HEAP-R2-NS-NV-00 | R21HENA-R1-NS-NV-01 | R33GSNC-HS-NS-NV-03 |
| R65HEAA-R2-RM-NV-02 | R43GENA-TS-NS-VS-00 | R34SSNT-TS-NS-NV-03 |
The content is from Ruichang Mingsheng Automation Equipment Co., LTD
Contact: +86 15270269218
