AMAT Applied Materials 0190-00405驱动硬盘
1.产 品 资 料 介 绍：
- 高速数据读写能力：采用企业级 SSD 存储架构（推测为 NVMe 协议），连续读取速度≥3500MB/s，连续写入速度≥3000MB/s，随机读写 IOPS（4K）分别达 500K/450K 以上，可快速存储与调取半导体设备的工艺参数文件（如 CVD 沉积参数、Etch 刻蚀程序）、实时运行日志（每秒生成 100 + 条数据），避免因读写延迟导致的设备卡顿，保障 24 小时连续制程的顺畅运行。
- 大容量与高耐用性：存储容量推测不低于 1TB，支持最大 4TB 扩展，可满足半导体设备长期数据存储需求（如保存 6 个月以上的工艺数据、设备维护记录）；采用 3D TLC/QLC 闪存颗粒，写入耐久度（TBW）≥600TB，按半导体设备日均 100GB 数据写入量计算，使用寿命可达 15 年以上，远超普通消费级硬盘，降低设备运维中的硬盘更换频率。
- 低延迟与抗掉电保护：内置 DRAM 缓存（推测容量≥1GB），可减少数据读写延迟，确保设备控制系统调用工艺程序时响应迅速；同时配备超级电容与掉电保护电路，当设备突发断电时，能将缓存中未写入闪存的数据安全保存，避免工艺数据丢失或文件损坏，防止因数据异常导致的晶圆报废风险。
- 宽温稳定运行特性：工作温度范围覆盖 - 40℃~85℃，能适应半导体设备内部的温度差异 —— 既可在靠近散热风扇的低温区域（约 10℃）稳定运行，也能耐受靠近加热腔的高温区域（约 60℃），且在温度剧烈波动时，硬盘读写性能衰减率≤3%，无卡顿、死机现象，保障数据存储连续性。
- 抗振动与冲击性能：通过工业级振动测试（5-500Hz，10g 加速度）与冲击测试（1500g 峰值加速度，0.5ms 脉冲），能耐受半导体设备机械臂运动、晶圆传输机构运行产生的振动，以及设备维护时的轻微碰撞，避免硬盘磁头损坏（机械硬盘）或闪存颗粒脱落（SSD），降低硬件故障风险；同时采用无机械结构的 SSD 设计（若为机械硬盘则配备强化抗震磁头），进一步提升抗振动能力。
- 防腐蚀与防尘设计：外壳采用铝合金材质并喷涂防腐蚀涂层，可抵御洁净车间中可能存在的微量腐蚀性气体（如刻蚀工艺中的氟化物、沉积工艺中的硅烷残留），避免外壳锈蚀或内部元器件腐蚀；接口处配备防尘密封圈，符合 IP54 防护标准，防止洁净车间的粉尘进入硬盘内部，堵塞接口或影响电路连接，保障数据传输稳定。
AMAT Applied Materials 0190-00405驱动硬盘 英文资料：
1、 High stability storage performance: adapted to the data storage needs of semiconductor devices
As the "data warehouse" of semiconductor equipment, this drive hard disk has high reliability and high-performance storage capabilities as its core, meeting the secure storage and fast call requirements of various data during equipment operation:
High speed data read and write capability: using enterprise grade SSD storage architecture (presumably NVMe protocol), continuous read speed ≥ 3500MB/s, continuous write speed ≥ 3000MB/s, random read and write IOPS (4K) of 500K/450K or more, can quickly store and retrieve process parameter files of semiconductor equipment (such as CVD deposition parameters, Etch etching program), real-time operation logs (generating 100+data per second), avoiding device lag caused by read and write delays, and ensuring smooth operation of 24-hour continuous processes.
Large capacity and high durability: The storage capacity is estimated to be no less than 1TB, supporting a maximum expansion of 4TB, which can meet the long-term data storage needs of semiconductor equipment (such as storing process data and equipment maintenance records for more than 6 months); Using 3D TLC/QLC flash memory particles, the write durability (TBW) is ≥ 600TB. Calculated based on the daily data write volume of 100GB for semiconductor devices, the service life can reach more than 15 years, far exceeding ordinary consumer grade hard drives and reducing the frequency of hard disk replacement in equipment maintenance.
Low latency and power down protection: Built in DRAM cache (estimated capacity ≥ 1GB) can reduce data read and write latency, ensuring fast response when the device control system calls the process program; Simultaneously equipped with supercapacitors and power failure protection circuits, when the device suddenly loses power, it can securely store data in the cache that has not been written to flash memory, avoiding process data loss or file damage, and preventing the risk of wafer scrap caused by data abnormalities.
2、 Strict environmental tolerance: to cope with complex working conditions in semiconductor manufacturing
Based on AMAT's specialized design for the semiconductor industry, this hard drive exhibits excellent environmental adaptability and can withstand harsh conditions in clean workshops and equipment interiors
Wide temperature stable operation characteristics: The working temperature range covers -40 ℃~85 ℃, and can adapt to temperature differences inside semiconductor devices - it can operate stably in low-temperature areas near the cooling fan (about 10 ℃), as well as withstand high-temperature areas near the heating chamber (about 60 ℃), and when the temperature fluctuates violently, the hard disk read and write performance degradation rate is ≤ 3%, without lagging or crashing, ensuring data storage continuity.
Anti vibration and impact performance: Through industrial grade vibration testing (5-500Hz, 10g acceleration) and impact testing (1500g peak acceleration, 0.5ms pulse), it can withstand the vibration generated by the movement of semiconductor equipment robotic arms, wafer transfer mechanisms, and minor collisions during equipment maintenance, avoiding damage to hard disk heads (mechanical hard disks) or detachment of flash memory particles (SSDs), and reducing the risk of hardware failure;
AMAT Applied Materials 0190-00405驱动硬盘 产品展示
产品视频
3.其他产品
MLJ1005B010H00C 控制器模块
MC-4/11/03/400 伺服驱动器
MOISTURE.IQ-1-6-1-1-1-0-0 分析仪
4.其他英文产品
WATLOW ANAFAZE CLS216 cable
OMACO GF0-57CQD-002 Touch screen
NI GPIB-140A/2 total line expander
| 710-658669-00 | 8005-MP-24 | 4136J54G4 |
| 710-658363-20 | 8005-LTV-101 | 4136J56-G1 |
| 710-658340-20 | 8005-LTC-101 | 8030-DLM-110 |
| 710-658232-20 | 8005-LNV-101 | 8030-DIM-101 |
| 710-658232-00 | 8005-EPS-51 | 8030-CRM-931 |
| 710-658172-20 | 8005-EPS-50 | 8030-CRM-720 |
The content is from Ruichang Mingsheng Automation Equipment Co., LTD
Contact: +86 15270269218
