KLA Tencor 720-23743-000放大器模块

KLA-Tencor  720-23743-000放大器模块

1.产 品 资 料 介 绍：

中文资料：

KLA Tencor 720-23743-000 放大器模块（Amplifier Module）

产品概述

KLA Tencor 720-23743-000 放大器模块是集成于KLA Tencor晶圆检测、量测或扫描设备中的关键电子组件，用于信号放大处理，确保微弱模拟信号能够以高保真度传送至后级处理系统。该模块通常与光电探测器、传感器或扫描探头协同工作，在纳米级检测任务中发挥核心作用。

主要功能

1. 微弱信号放大
   对来自传感器或探测器的低电平模拟信号进行高增益放大，提升信号强度，使其适合后级ADC转换和数字处理。

2. 信号滤波与整形
   内部集成低通或带通滤波电路，用于抑制高频噪声和干扰，改善信噪比（SNR），输出更稳定的信号波形。

3. 阻抗匹配与隔离
   提供输入输出阻抗匹配，避免信号反射，确保与其他模块之间的电气兼容性和稳定通讯。

4. 保护与稳压机制
   内设过压、过流与短路保护功能，可在异常情况下自动断开输出，防止设备损坏。

技术特性

• 高增益线性放大电路，适用于纳伏至毫伏级别的信号输入；

• 低噪声放大器芯片（LNA），保持高信号保真度；

• 宽频响应，适应高速扫描和高频图像采集任务；

• 稳定工作温度范围：支持工业级环境（通常为 0°C ~ 70°C 或更广）；

• 模块化封装设计，便于现场快速更换、调试与维护。

典型应用场景

1. 晶圆缺陷检测系统
   处理从光电探头获取的微弱信号，对微米或纳米级缺陷进行分析与判断。

2. 光学成像系统
   与图像传感器联动，用于增强低照度下采集图像信号，提高成像分辨率与清晰度。

3. 粒子监测设备
   对检测到的粒子碰撞信号进行放大，提升分析系统的灵敏度与识别率。

4. 表面轮廓量测设备
   与激光干涉仪或微位移传感器搭配，输出被测表面变化的电信号，实现高精度检测

英文资料：

KLA Tencor 720-23743-000 Amplifier Module

product overview

The KLA Tencor 720-23743-000 amplifier module is a critical electronic component integrated into KLA Tencor wafer inspection, measurement, or scanning equipment, used for signal amplification processing to ensure that weak analog signals can be transmitted to the post-processing system with high fidelity. This module typically works in conjunction with photodetectors, sensors, or scanning probes, playing a central role in nanoscale detection tasks.

major function 

Weak signal amplification

Amplify low-level analog signals from sensors or detectors with high gain to enhance signal strength, making them suitable for subsequent ADC conversion and digital processing.

Signal filtering and shaping

Internally integrated low-pass or band-pass filtering circuits are used to suppress high-frequency noise and interference, improve signal-to-noise ratio (SNR), and output more stable signal waveforms.

Impedance matching and isolation

Provide input/output impedance matching to avoid signal reflection, ensure electrical compatibility and stable communication with other modules.

Protection and voltage stabilization mechanism

Equipped with overvoltage, overcurrent, and short-circuit protection functions, it can automatically disconnect the output in abnormal situations to prevent equipment damage.

Technical Characteristics

High gain linear amplifier circuit, suitable for signal inputs ranging from nanovolts to millivolts;

Low noise amplifier chip (LNA), maintaining high signal fidelity;

Broadband response, suitable for high-speed scanning and high-frequency image acquisition tasks;

Stable operating temperature range: supports industrial grade environments (usually 0 ° C~70 ° C or wider);

Modular packaging design facilitates quick on-site replacement, debugging, and maintenance.

Typical application scenarios

Wafer defect detection system

Process weak signals obtained from photoelectric probes to analyze and judge micro - or nano scale defects.

optical imaging system

Linked with image sensors, it is used to enhance the acquisition of image signals under low light conditions, improve imaging resolution and clarity.

Particle monitoring equipment

Amplify the detected particle collision signals to enhance the sensitivity and recognition rate of the analysis system.

Surface contour measurement equipment

Paired with laser interferometers or micro displacement sensors, output electrical signals of surface changes to achieve high-precision detection

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