KLA-Tencor 073-653015-00控制板
1.产 品 资 料 介 绍:
中文资料:
KLA Tencor 073-653015-00 控制板是一款用于半导体晶圆缺陷检测设备的关键电子模块,主要应用于 KLA Tencor 2132 系列设备中。
产品类型
部件号:073-653015-00
相关型号:710-659465-20(KLA 8IB Board)
制造商:KLA Tencor
产品应用领域
晶圆缺陷检测系统
用于 KLA Tencor 2132 系列晶圆缺陷检测设备,负责图像采集、数据处理及设备整体控制,保证检测系统高效运行。系统模块间信号协调
该控制板协调设备内部各子系统(如图像采集单元、数据处理模块、运动控制系统)之间的信号传输,实现高效、准确的缺陷检测。高精度检测环境下的稳定运行
具备良好的电气性能和抗干扰能力,保证信号完整性和系统稳定性,提高检测的可靠性和准确性。
典型使用环境
半导体制造厂,如台积电、三星、英特尔等,在晶圆制造过程中使用该系列设备进行缺陷检测。
工艺研发和质量控制实验室,用于新工艺开发及产品质量控制中的高精度缺陷分析。
英文资料:
The KLA Tencor 073-653015-00 control board is a key electronic module used in semiconductor wafer defect detection equipment, mainly applied in the KLA Tencor 2132 series equipment.
product type
Part number: 073-653015-00
Related model: 710-659465-20 (KLA 8IB Board)
Manufacturer: KLA Tencor
Product application areas
Wafer defect detection system
Used for KLA Tencor 2132 series wafer defect detection equipment, responsible for image acquisition, data processing, and overall equipment control to ensure efficient operation of the detection system.
Signal coordination between system modules
This control board coordinates the signal transmission between various subsystems within the device, such as image acquisition units, data processing modules, and motion control systems, to achieve efficient and accurate defect detection.
Stable operation in high-precision detection environment
Having good electrical performance and anti-interference ability, ensuring signal integrity and system stability, and improving the reliability and accuracy of detection.
Typical usage environment
Semiconductor manufacturers such as TSMC, Samsung, Intel, etc. use this series of equipment for defect detection in the wafer manufacturing process.
Process research and quality control laboratory, used for high-precision defect analysis in new process development and product quality control.
2.产 品 展 示
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The content is from Ruichang Mingsheng Automation Equipment Co., LTD
Contact: +86 15270269218