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KLA Tencor 750-693047-002接口板

发布时间:2025-06-17人气:
  • KLA Tencor  750-693047-002接口板
  • KLA Tencor  750-693047-002接口板
  • KLA Tencor  750-693047-002接口板

KLA-Tencor 750-693047-002接口板

1.产 品 资 料 介 绍:

中文资料:

一、产品名称与识别

  • 产品型号:750-693047-002

  • 制造商:KLA Tencor

  • 产品类型:接口板 / 工业嵌入式主控单元

  • 常见标识:在部分系统中也标注为“IMMECOR Dual Pentium RAID IPC CE400”


二、功能概述

该接口板是一种内嵌式工业级计算平台,集成了以下核心功能:

  1. 双 Pentium CPU 支持:用于高性能控制和并行处理任务;

  2. RAID 存储支持:提供多硬盘冗余存储配置,确保检测系统的数据完整性;

  3. 多功能 I/O 接口:支持与扫描仪、图像处理单元、控制器及人机界面设备通信;

  4. 适用于定制化工控环境:能够在高温、低噪、高干扰环境中稳定运行。


三、典型应用领域

  1. CD-SEM 晶圆检测设备

    • 作为主控单元运行系统控制逻辑、聚焦控制、图像处理等功能;

    • 支持系统中图像采集、数据处理与设备反馈控制任务;

    • 用于晶圆关键尺寸量测和缺陷分析工艺流程中。

  2. 光学和电子束检测平台

    • 控制多种传感器信号通道与反馈环路;

    • 支持图像校正、设备调焦、平台定位等智能判断与控制操作。

  3. 数据采集与分析主机

    • 结合 RAID 架构,保障采集图像和测试数据的高速写入与安全保存;

    • 可接入上位机或MES系统,实现自动数据归档与分析。

英文资料:

1、 Product Name and Identification

Product model: 750-693047-002


Manufacturer: KLA Tencor


Product Type: Interface Board/Industrial Embedded Control Unit


Common identifier: Also labeled as "IMMECOR Dual Pentium RAID IPC CE400" in some systems


2、 Function Overview

This interface board is an embedded industrial grade computing platform that integrates the following core functions:


Dual Pentium CPU support: used for high-performance control and parallel processing tasks;


RAID storage support: Provides redundant storage configuration for multiple hard drives to ensure data integrity of the detection system;


Multi functional I/O interface: supports communication with scanners, image processing units, controllers, and human-machine interface devices;


Suitable for customized chemical control environments: capable of stable operation in high temperature, low noise, and high interference environments.


3、 Typical application areas

CD-SEM wafer inspection equipment


As the main control unit, it runs system control logic, focus control, image processing and other functions;


Support image acquisition, data processing, and device feedback control tasks in the system;


Used in the critical dimension measurement and defect analysis process of wafers.


Optical and electron beam detection platform


Control multiple sensor signal channels and feedback loops;


Support intelligent judgment and control operations such as image correction, device focusing, and platform positioning.


Data collection and analysis host


Combining RAID architecture to ensure high-speed writing and secure storage of collected images and test data;


Can be connected to the upper computer or MES system to achieve automatic data archiving and analysis.

2.产      品      展      示      

corona_8_e_matrox_pci_frame_grabber_pcb_kla_538590_750-693047-002_ipc_ce400.jpg

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The content is from Ruichang Mingsheng Automation Equipment Co., LTD

Contact: +86 15270269218

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