OLYMPUS U-AFA2M-VIS显微镜自动对焦单元

OLYMPUS U-AFA2M-VIS显微镜自动对焦单元 

1.产 品 资 料 介 绍：

OLYMPUS U-AFA2M-VIS 显微镜自动对焦单元产品特点

开头：OLYMPUS U-AFA2M-VIS 是奥林巴斯工业检测显微镜专用激光自动对焦单元，适配明场检测光路，成像对焦稳定高效，核心特点如下：

采用分瞳反射式有源激光对焦，成像定位精准稳定

775-800nm 一级安全红外激光，无肉眼强光伤害

100Hz 高频脉冲对焦，移动载台实时持续追焦

多点激光投射设计，样品表面凹凸不易失焦

单次对焦响应速度快，大幅缩短检测等待时间

激光光斑细小，微小晶圆、线路局部均可对焦

适配多款奥林巴斯 MX、BX 系列检测显微镜机身

兼容 DIC 微分干涉、明暗场多种观测光路

搭配专用控制器与配套软件，参数可视化调节

低功耗激光模组，长时间连续工作不易发热

内置信号滤波，车间电磁干扰下对焦不漂移

标准模块化卡口，拆装替换无需调整光路

支持单次对焦、持续追踪两种工作模式切换

全金属精密光学腔体，防尘适配无尘车间环境

对焦高度范围充足，适配不同厚度待测样品

结尾：OLYMPUS U-AFA2M-VIS 对焦精度高、兼容性强，是半导体、电子元器件自动化显微检测核心配件。

OLYMPUS U-AFA2M-VIS显微镜自动对焦单元  产品英文

Olympus U-AFA2M-VIS Microscope Autofocus Unit Product Features

Introduction: Olympus U-AFA2M-VIS is a specialized laser autofocus unit for Olympus industrial inspection microscopes, adapted to bright field detection light paths, with stable and efficient imaging focusing. Its core features are as follows:

Adopting split pupil reflective active laser focusing, accurate and stable imaging positioning

775-800nm first level safe infrared laser, no visible strong light damage to the naked eye

100Hz high-frequency pulse focusing, real-time continuous tracking of the moving stage

Multi point laser projection design, the sample surface is uneven and not easily defocused

Fast single focus response speed, significantly reducing detection waiting time

The laser spot is small, and small wafers and local circuits can be focused on

Compatible with multiple Olympus MX and BX series inspection microscope bodies

Compatible with DIC differential interference and multiple observation optical paths in both bright and dark fields

Paired with dedicated controller and supporting software, parameter visualization adjustment

Low power laser module, working continuously for a long time without generating heat easily

Built in signal filtering, focusing does not drift under workshop electromagnetic interference

Standard modular mount, disassembly and replacement without adjusting the optical path

Supports switching between single focus and continuous tracking modes

All metal precision optical cavity, dust-proof and suitable for dust-free workshop environment

Adequate focusing height range, suitable for samples of different thicknesses to be tested

Conclusion: OLYMPUS U-AFA2M-VIS has high focusing accuracy and strong compatibility, and is a core component for automated microscopic inspection of semiconductor and electronic components.

OLYMPUS U-AFA2M-VIS显微镜自动对焦单元  产品展示

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The content is from Ruichang Mingsheng Automation Equipment Co., LTD

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