1.产 品 资 料 介 绍：
TEL 3281-000014-16晶圆探针系统模块 产品英文介绍
TEL 3281-000014-16 Wafer Probe System Module
Product Features:
1. Adapt to TEL probe station, control the test signals between probe card and wafer
2. The signal isolation is done well, and weak test signals are not easily interfered with
3. The timing coordination between positioning and testing is stable, and the probe contact repeatability is good
4. The interface is consistent with the original, and can be repaired or replaced directly by installing it
5. Stable components, suitable for long-term continuous chip testing in clean workshops
Application fields:
6. TEL wafer probe station testing signal control
7. Chip wafer level electrical testing
8. Probe card signal conversion and acquisition
9. Semiconductor quality testing station
10. Storage chip wafer detection
11. Replacement of TEL probe equipment spare parts
12. Probe station upgrade and renovation project
13. Supporting wafer aging testing system
14. Chip testing fixture signal unit
15. Maintenance of semiconductor front-end testing equipment
The TEL 3281-000014-16 wafer probe system module is a key spare part responsible for the interaction of wafer electrical testing signals in the probe station.
TEL 3281-000014-16晶圆探针系统模块 产品展示
视频展示
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The content is from Ruichang Mingsheng Automation Equipment Co., LTD
Contact: +86 15270269218
